The Flash_Destroyer finally succeeded in rewriting that EEPROM until its demise. When we originally looked at the device it had already recorded 2.5 million successful rewrites. The first appearance of corrupt data occurred at 11,494,069 but that doesn’t tell the whole story. The chip kept working for another 200,000 rewrites before finally showing repeated data corruption.
We do find the writeup pretty interesting. There’s one thing that we can’t stop coming back to though. In the discussion of our original article [Tiago] pointed out that long-term data retention isn’t being tested here. If the abuse of that EEPROM had ended after say five million rewrites, would it have been able to hold the data long-term without corruption? Let us know what you think in the comments.